Ann: 4DS Update-Progress at imec, page-43

So the megabit chip works on the platform - GOOD NEWS

The additional wafers lot:

- Pretty much as fast as DRAM - GOOD NEWS
- Endurance of the cells is at least 2-3 times better - but needs more analysis to better define - meaning it needs to be integrated onto the platform and tested in the 4DS facility. Remember they only have so much time to test the wafers in IMEC, and only integrated platform lots get to leave the facility for testing. That means to me - GOOD NEWS, they couldn't break it.
- Retention - upper limits need to be better defined - which to me reads as the testing and analysis needs to be run for longer to get statistical reliability of retention - GOOD NEWS, they couldn't break it.

Essentially they have said, "We developed a new iteration which is significantly better and we couldn't test it for long enough to break it"