4DS - Anything but Charting, page-27733

What prompted these thoughts was wording in both recent megabit success announcements where they stated in the first that"Within the fully functioning megabit array..." and in the Further Megabit Success announcement "Today the company is pleased to confirm that following additional testing within the megabit array,,,". The word "within" got me thinking that they must be testing subsets within the array, rather than the array as a whole. I asked David if the memory is tuneable post fabrication or rather tuned via differing process conditions and he confirmed the later.