We have come so far from PL3, I think it would be naïve to think the company is in the same situation.
- PL4 worked at 60nm
- The etching issue causing the failure of PL3 was fixed by a completely new pattern. You would expect the testing process at imec to change to include new steps in testing of the failure to make sure it has not re-occured, before they conclude the lot is manufactured successfully.
- The company moved from an in house test jig to an actual commercial test system - and when they did so, they were able to get conclusive results from PL3 that they were not able to get on their own system.
We have come so far from PL3, I think it would be naïve to think...
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