No.
The malfunction/problem with the etch still remains. They just found a way to give the cells some extra current to overcome the high resistance within the etch layer and apply the correct write voltage to the cells. And now they can confirm that, under all the mess of the bad etch, the cells in the array are intact and if connected properly to a switching layer, it would have functioned as planned.
Nothing to do with the test equipment being faulty. Everything to do with that etch being inadequate.
Ann: Renewed Technical Progress Update, page-183
-
- There are more pages in this discussion • 58 more messages in this thread...
You’re viewing a single post only. To view the entire thread just sign in or Join Now (FREE)
