CXO888 / any other attendees, page-22

nice pick up- interlayers between electrodes may be attempting to prevent the diffusion of the oxygen ions leading to a back migration over time, which existing data on the material supports - that is where retention loss / degradation occurs - so I imagine ongoing testing is clarifying these inputs - epirs + voltage through exhaustive hrs/lrs cycles under altered thermal conditions of operation to characterise 'altered' drift, back migration, bulk area resistance states through the cycle time range = definitive numbers on retention achieved under each of these 'test' conditions, along with the other quality data obtained so far

building a discrete data set to take into 20nm ?...a test benchmark off a successful 60nm
just guessing of course