The present invention discloses a short-circuit test method and system for a digital sound chip, which relates to the field of circuit testing technology, and solves the problem of how to perform short-circuit detection on the internal pixel unit of the digital sound chip. The method includes: obtaining contact test detection data; judging whether the short-circuit test device is successfully connected to the digital sound chip based on the contact test detection data; if the short-circuit test device is successfully connected to the digital sound chip, a preset low-voltage short-circuit test strategy is used to perform a low-voltage short-circuit test on the digital sound chip to obtain first short-circuit test data; based on the first short-circuit test data, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip to obtain second short-circuit test data; based on the first short-circuit test data and the second short-circuit test data, the short-circuit test result of the digital sound chip is determined; thereby realizing short-circuit detection on the internal pixel unit of the digital sound chip.
1. A short circuit test method for a digital sound chip, applied to an FPGA logic control module, characterized in that the method comprises:
Acquire contact test detection data; the contact test detection data represents detection data generated after the short-circuit test device is connected to the digital sound chip; the short-circuit test device is used to perform a short-circuit test on the digital sound chip;
Based on the contact test detection data, it is determined whether the short-circuit test device is successfully connected to the digital sound chip; the successful connection indicates that each channel of the digital sound chip is successfully connected to the short-circuit test device;
If the short-circuit test device is successfully connected to the digital sound chip, a preset low-voltage short-circuit test strategy is used to perform a low-voltage short-circuit test on the digital sound chip to obtain first short-circuit test data;
Based on the first short-circuit test data, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip to obtain second short-circuit test data;
Based on the first short-circuit test data and the second short-circuit test data, a short-circuit test result of the digital sound chip is determined; the short-circuit test result is used to indicate the short-circuit state of the digital sound chip.
2. The method according to claim 1, characterized in that the low-voltage short-circuit test on the digital sound chip using a preset low-voltage short-circuit test strategy also includes:
Based on the contact test detection data, determine a plurality of test channels through which the FPGA logic control module is connected to the digital sound chip;
The method of performing a low-voltage short-circuit test on the digital sound chip using a preset low-voltage short-circuit test strategy specifically includes:
Based on a preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a first channel among the multiple test channels; the preset low-voltage short-circuit test strategy is to set the first channel among the multiple test channels to be turned on, and the remaining test channels to be grounded, and to use low voltage polling to poll the multiple test channels;
After the low-voltage short-circuit test of the first channel is completed, based on the preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a second channel among the multiple test channels; the second channel and the first channel are different test channels.
3. The method according to claim 2, wherein the step of performing a high voltage short circuit test on the digital sound chip using a preset high voltage short circuit test strategy comprises:
Based on a preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a third channel among the multiple test channels; the preset high-voltage short-circuit test strategy is to set the third channel among the multiple test channels to be turned on, and the remaining test channels to be grounded, and to use high voltage to poll the multiple test channels;
After the high-voltage short-circuit test of the third channel is completed, based on the preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a fourth channel among the multiple test channels; the fourth channel and the third channel are different test channels.
4. The method according to claim 2 or 3, characterized in that, in the process of polling the plurality of test channels, it comprises:
If an abnormal voltage or current is detected in any test channel, the channel is determined to be a short-circuit channel; the voltage abnormality indicates that the detected voltage is greater than the rated voltage of the digital sound chip; the current abnormality indicates that the detected current is greater than the rated current of the digital sound chip.
5. The method according to claim 1, wherein the step of performing a high voltage short circuit test on the digital sound chip using a preset high voltage short circuit test strategy further comprises:
Based on the first short-circuit test data, determining whether all channels of the digital sound chip have completed the low-voltage short-circuit test;
If all channels of the digital sound chip have completed the low-voltage short-circuit test, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip.
6. The method according to claim 1, wherein determining the short circuit test result of the digital sound chip comprises:
Based on the first short-circuit test data, obtaining a first short-circuit test result for each channel of the digital sound chip;
Based on the second short-circuit test data, obtaining a second short-circuit test result for each channel of the digital sound chip;
If the first short-circuit test result or the second short-circuit test result indicates that a short-circuit channel exists in the digital sound chip, a test result indicating that the digital sound chip is in a short-circuit state is determined.
7. The method according to claim 6, further comprising:
Determine a plurality of short-circuit channels of the digital sound chip based on the first short-circuit test result and the second short-circuit test result;
The fifth channel among the multiple short-circuit channels is set to be turned on, and the other channels of the digital sound chip are suspended; the sixth channel among the suspended channels is grounded, and a high-voltage short-circuit test strategy is used to perform a one-to-one test between the sixth channel and the fifth channel to obtain third short-circuit test data;
If the result indicated by the third short-circuit test data is abnormal voltage or abnormal current, it means that the sixth channel and the fifth channel are short-circuited with each other.
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